Technology Educating Sources With Brittany Washburn

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The Surfscan Product Group develops unpatterned wafer floor inspection tools that present the sensitivity and throughput required for qualification of present and next-generation semiconductor wafer substrates, as well as qualification and monitoring of course of instruments. Semiconductor system yields begin with naked wafers, and our leading expertise gives early insight into surface defect, shape, flatness and Nano topography of the superior 300mm substrates. Our optical inspection and metrology instruments will help the following several generations of wafer and IC manufacturing. We incorporate UV laser technology, darkfield optics and superior algorithms to finds defects down to 20nm in dimension and permits constant, excessive sensitivity detection on engineered substrates. Surfscan tools are the acknowledged market-leader within the unpatterned wafer inspection business.

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